Bipolar effects in snapback mechanism in advanced n-FET transistors under high current stress conditions
![Influence of high-frequent signals on the hold current behaviour of snapback ESD protection diodes - YouTube Influence of high-frequent signals on the hold current behaviour of snapback ESD protection diodes - YouTube](https://i.ytimg.com/vi/HbSFoXqiM-c/hq720.jpg?sqp=-oaymwE7CK4FEIIDSFryq4qpAy0IARUAAAAAGAElAADIQj0AgKJD8AEB-AH-CYAC0AWKAgwIABABGA8gZShkMA8=&rs=AOn4CLCct_lho0XN3_MQf3B5LzLV8NQAJA)
Influence of high-frequent signals on the hold current behaviour of snapback ESD protection diodes - YouTube
The dangers of deep snap-back ESD circuit-protection diodes - Analog - Technical articles - TI E2E support forums
![Measured IV-curve and simplified model for ESD-protection elements with... | Download Scientific Diagram Measured IV-curve and simplified model for ESD-protection elements with... | Download Scientific Diagram](https://www.researchgate.net/publication/26633929/figure/fig1/AS:310018692927491@1450925624371/Measured-IV-curve-and-simplified-model-for-ESD-protection-elements-with-snapback-behavior.png)
Measured IV-curve and simplified model for ESD-protection elements with... | Download Scientific Diagram
![TLP measurement of ESD Protection Devices - iST-Integrated Service Technology - TLP measurement of ESD Protection Devices TLP measurement of ESD Protection Devices - iST-Integrated Service Technology - TLP measurement of ESD Protection Devices](https://www.istgroup.com/en/wp-content/uploads/2017/07/Service_FA_esd-tlp_03.jpg)
TLP measurement of ESD Protection Devices - iST-Integrated Service Technology - TLP measurement of ESD Protection Devices
![Figure 2 from A Study of Snapback and Parasitic Bipolar Action for ESD NMOS Modeling | Semantic Scholar Figure 2 from A Study of Snapback and Parasitic Bipolar Action for ESD NMOS Modeling | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/657e63b8be79c1adb0fdddc63cb3433d8c9cb751/2-Figure2-1.png)
Figure 2 from A Study of Snapback and Parasitic Bipolar Action for ESD NMOS Modeling | Semantic Scholar
![Electronics | Free Full-Text | The ESD Characteristics of a pMOS-Triggered Bidirectional SCR in SOI BCD Technology Electronics | Free Full-Text | The ESD Characteristics of a pMOS-Triggered Bidirectional SCR in SOI BCD Technology](https://www.mdpi.com/electronics/electronics-11-00546/article_deploy/html/images/electronics-11-00546-g001.png)